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Comparison between standard and near-field cathodoluminescenceHEIDERHOFF, R; SERGEEV, O. V; LIU, Y. Y et al.Journal of crystal growth. 2000, Vol 210, Num 1-3, pp 303-306, issn 0022-0248Conference Paper

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Detection the specific marker of CD3 molecules of human peripheral blood T lymphocytes using SNOM and quantum dotsLIYUN ZHONG; WENTAO LIAO; XIAOPIN WANG et al.Colloids and surfaces. A, Physicochemical and engineering aspects. 2008, Vol 313-314, pp 642-646, issn 0927-7757, 5 p.Conference Paper

Theoretical investigations of a coaxial probe concept for scanning near-field optical microscopyRUDOW, O; VOLLKOPF, A; MÜLLER-WIEGAND, M et al.Optics communications. 2001, Vol 189, Num 4-6, pp 187-192, issn 0030-4018Article

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Near-field optical investigation of porous silicon samplesALLEGRINI, M; FUSO, F; LABARDI, M et al.Philosophical magazine. B. Physics of condensed matter. Statistical mechanics, electronic, optical and magnetic properties. 2000, Vol 80, Num 4, pp 611-621, issn 1364-2812Conference Paper

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Subdiffraction-limit light microscopy with specific application to silver halide researchVAEZ-IRAVANI, M.The Journal of imaging science and technology. 1998, Vol 42, Num 1, pp 31-38, issn 1062-3701Article

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Electromagnetic near field induced by surface defects in microstructuresLI, Z.-Y; YANG, G.-Z; GU, B.-Y et al.SPIE proceedings series. 1997, pp 338-347, isbn 0-8194-2419-6Conference Paper

Near-field microscopy moves into the mainstreamCOLLINS, G. J.Laser focus world. 1995, Vol 31, Num 11, pp 104-107, issn 1043-8092Article

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Sub-micron spatial resolution Raman spectroscopy and its application to stress mapping in siliconWEBSTER, S; SMITH, D. A; BATCHELDER, D. N et al.Synthetic metals. 1999, Vol 102, Num 1-3, pp 1425-1427, issn 0379-6779Conference Paper

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Nanometer scale apertureless near field microscopyGRESILLON, S; DUCOURTIEUX, S; LAHRECH, A et al.Applied surface science. 2000, Vol 164, pp 118-123, issn 0169-4332Conference Paper

Nano-optical image and probe in a scanning near-field optical microscopeHOSAKA, S; SHINTANI, T; KIKUKAWA, A et al.Applied surface science. 1999, Vol 140, Num 3-4, pp 388-393, issn 0169-4332Conference Paper

Method for increasing sensitivity of shear-force distance control for scanning near-field microscopyKANTOR, R; LESNAK, M; BERDUNOV, N et al.Applied surface science. 1999, Vol 144-45, pp 510-513, issn 0169-4332Conference Paper

Non-optical shear-force detection for scanning near-field optical microscopeTAMARU, H; MIYANO, K.Japanese journal of applied physics. 1997, Vol 36, Num 6B, pp L821-L823, issn 0021-4922, 2Article